Main advantages & characteristics:
 
1. Directly from sample to result
With Nano-inXider's intelligent design, you only need to put your samples in the sample bin, and then you can get the results. The process is very simple and quick.
 
Sample-
Simple operation. Just put your sample in the sample bin. The instrument can be calibrated automatically without user intervention.
 
Test-
Automatic and quick data acquisition process. X-ray scattering data is automatically normalized without user calibration. This is achieved through a powerful software suite embedded in fully automatic equipment and a unique fixed dual detector configuration.
 
Analysis-
The accurate scattering data displayed by the instrument can be used for real-time and rapid sample feedback, or for further auxiliary analysis using our XSACT software. The analysis functions are widely selected, and the nanostructure parameters can be quickly obtained with only a few clicks.
 
Report-
XSACT generates high-quality publishable charts that can be easily exported to other documents by dragging and dropping or saving files.
 
Save time-
Nano-inXider can get results faster and analyze data more simply
Easy to use. Intelligent design can make the small angle scattering scholars, materials science scientists and technical personnel quickly grasp.
With complete remote operation capability and automatic calibration, Nano-inXider minimizes human error and ensures reproducibility and measurement traceability.
It is an ideal choice for open operation laboratory.
 
+ Nano-inXider Fully Automated Workflow
Nano-inXider data acquisition software has the following user-friendly interactive interface:
-Viewing 2D and 1D data in real time during acquisition
-Automatic calibration
-Traceability testing process
 
Without any user intervention, the automated workflow can process all of the following data
-Data restoration from 2D image to 1D curve
-Absolute intensity normalization
Automatically lower the cosmic background to reduce the influence of parasitic scattering
 
XSACT Analysis Software
XSACT: X-ray scattering analysis and calculation tool
-Intelligent workflow and user experience
-Powerful data analysis algorithm composition
-High-quality data maps can be published directly
 
2. High precision and high dynamic range measurement
Get reliable data and focus your attention on science and data interpretation.
Nano-inXider can obtain high signal-to-noise ratio data by measuring the strong straight-through light passing through the sample and the low scattering intensity signal of the sample.
Through advanced beamstop-free data acquisition for direct light measurement, automatic processing of data and high accuracy of absolute intensity. Pure light technology can detect low-intensity signals and high-intensity signals simultaneously.
The high dynamic range of intensity acquisition directly affects the data quality:
Low-intensity scattering signals of weak scattering samples can be detected
Parameters such as particle number, molar mass, concentration and specific surface area were obtained quantitatively
-Detecting large feature sizes without data processing by users
 
+ pure light technology is suitable for high dynamic range measurement
Nano-inXider achieves the best balance between high X-ray flux on samples and low parasitic scattering generated by instruments through 15 years of research and development in advanced components and instrument design.
Pure light technology has the following main components and characteristics:
-Micro-focusing sealed tube light source (30W) combined with patented single reflection multilayer focusing mirror
-Patented automatic non-scattering collimation technology
-The instrument is in a vacuum environment from the focusing mirror to the sensor layer of the detector
-High Efficiency and Low Noise Mixed Pixel Photon Counter Detector
-SAXS detector without windowing film
 
+ High quality data can be obtained without beamstop acquisition
Nano-inXider can perform SAXS measurement without any beamstop, and can also collect straight-through light and very low-intensity scattering signals passing through samples at the same time.
High dynamic range data collection can be achieved through advanced beamstop-free data collection.
Through light is recorded in the whole acquisition process, which makes the transmission test more accurate, and thus makes the absolute scattering intensity correction more accurate.
In addition, the measured straight-through light (resolution function) will be integrated into the data analysis to improve the quality of the measurement results.
Xenocs beamstop-free data acquisition realizes automatic qmin measurement depending on samples, and eliminates parasitic scattering at beamstop edges, thus obtaining high-quality data in low q regions.
 
+ Reduce the cosmic background
Automatic removal of cosmic background can reduce the influence of environmental parasitic scattering.
 
3. From atomic level to nanometer size at the same time
Without repeating SAXS and WAXS tests, you can get all measurements simultaneously in one exposure.
Nano-inXider's unique intelligent dual detector design can simultaneously detect atomic scale information and nanostructures in one exposure. The vertical design of the equipment occupies a small area, and the distance from the sample to the detector is long, so that large feature sizes can be measured.
These configurations can provide the following unique advantages:
-You can obtain nanostructure information and atomic scale information in one exposure. There is no need to repeat the experiment.
Since the samples analyzed in SAXS and WAXS are of the same volume, clear data can be obtained for non-uniform samples.
-The detection of sample structure at atomic and nanometer scales is completely synchronous, which is necessary for in-situ research.
 
+ Double fixed detector design for simultaneous SAXS and WAXS measurements
Nano-inXider's sample and detector are fixed. The optional WAXS detector configuration expands the scattering range, which can seamlessly connect SAXS detectors, and the obtained data reaches 2 θ = 60.
For anisotropic samples such as fibers or oriented films, Nano-inXider equipped with a sample turntable can obtain anisotropic scattering signals. Automatic acquisition includes the following steps:
During continuous exposure, the sample stage rotates around X-rays
-Automatically merge the obtained images
-A 2D map showing high azimuth (azimuth coverage is greater than 200 for all q ranges detected by the instrument, even if it is as high as 2 θ = 60 °)
 
 
4. Low cost
Accelerate your material processing process or validate your research model through the nanoscale information obtained every day.
-High returns
-The vertical design of the instrument reduces the occupied laboratory space
-Convenient operation by technicians
-The high utilization rate of instruments brings about the high yield of scientific research results
-More environmentally friendly
Nano-inXider's low cost is mainly due to its compact design and low operating cost.
 
+ Compact instruments
-floor area < 1 × 1 m2
-Weight ≈ 520 kg
-Integrated equipment
-Easy installation of horizontal samples
 
+ Low operating costs
-Low average power dissipation approximately 700 W
-Two-year warranty for instruments
-Maintenance-free light source with three-year warranty
-Simple and sturdy