XploRA PLUS is a fully automatic ultra-fast micro Raman imaging spectrometer, which combines many unique functions, not only has excellent performance, but also is easy to use and fast to analyze. It is very suitable for multi-user operation and switching analysis of various samples, and is an ideal choice for research work and analysis center.
XploRA PLUS is equipped with unique SWIFT fast imaging function, which can realize ultra-fast confocal Raman imaging, which is 10 times faster than ordinary imaging speed. True confocal design enables it to ensure high imaging quality and spatial resolution even under the condition of ultra-fast imaging.
In addition, XploRA PLUS also has unparalleled scalability, such as polarization Raman, particle analysis and Raman AFM combination.
Characteristics:
路 SWIFTTM Ultra-fast Imaging
Raman imaging of three-dimensional surface topography
True confocal performance
Complete optical microscope performance
Optimized resolution, multiple spectrum collection ranges
HORIBA's unique OneClick Raman analysis function
NIST (National Institute of Standards and Technology) certification, automatic calibration technology
Excellent optical stability-provides reliable long-term detection
Automated operation
System extensions:
Raman AFM combined with TERS (tip enhanced Raman)
Multiple excitation wavelengths-suitable for all kinds of samples and optimize experimental results
Professional Raman database-rapid identification and analysis
ParticleFinder-Intelligent Particle Statistics and Chemical Analysis Module
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