Zeta-20 desktop optical profiler is a non-contact 3D surface topography measurement system. The system adopts ZDot ™ patented technology and Multi-Mode optical system, which can measure various samples: transparent and opaque, reflectivity from low to high, texture from smooth to rough, and step height from nanometer to millimeter.
 
Zeta-20 is flexible and easy to use, and integrates six different optical measurement technologies. ZDot ™ measurement mode can capture high-resolution 3D data and True Color infinity focus images at the same time. Other 3D measurement techniques include white light interferometry, Nomarski interference contrast microscope and shear interferometry. ZDot or integrated broadband reflectometer can measure the film thickness. Zeta-20 is also a high-end microscope, which can be used for sample re-inspection or automatic defect detection. Zeta-20 is suitable for R&D and production environments by providing comprehensive step height, roughness and film thickness measurement and defect detection functions.