Efficient scientific research grade energy spectrometer
The new micro-focusing monochromatic X-ray source can continuously adjust the X-ray spot size from 10 μ m to 400 μ m with a step size of 5 μ m, thus ensuring that the analysis beam spot can be adjusted to match the target characteristics. Excellent sensitivity and efficient data acquisition can be achieved with upgraded X-ray sources, efficient electronic lenses and optimized detectors.
 
# Insulator analysis
The one-button automatic charge compensation system on Nexsa G2 system can easily realize insulation sample analysis. The patented double-beam neutralization source avoids charging of insulating samples, because using extremely low-energy electrons, charge correction will not be required in most cases.
 
 
# Deep profiling
The Nexsa G2 system is equipped with a standard ion source or MAGCIS (optional single event and gas cluster hybrid ion source) for depth profiling. Automatic ion source optimization and gas path control ensure excellent performance and experimental reproducibility.
 
 
# Multi-technology combination
With the Nexsa G2 system, all technologies will be at your fingertips, and a system will fully analyze your samples. The standard configuration has all the functions required by high-performance XPS, and ISS, UPS, REELS, Raman and other analysis technologies are integrated. Upgrade option converts the system into a complete analysis workstation, which helps solve material analysis problems and improve production efficiency.
 
 
# Special sample table optional
Nexsa G2 has added a variety of sample stations to meet the special application requirements of scientific research. Special optional sample tables are: NX heating table, which is used for in-situ sample heating analysis; Multi-contact bias sample table, which can realize XPS in-situ analysis of samples after applying voltage, bias voltage or circulating electrodes in vacuum system; Inert gas transfer chamber can realize vacuum/inert gas protection transfer of air sensitive samples; MCA Sample Station is used for the correlation analysis of XPS + SEM, which can collect data from the same analysis area of samples by XPS technology and electron microscopy technology, and compare and analyze them.