Standardization features give birth to powerful performance:
Insulator analysis
路 High Performance XPS Performance
In-depth analysis
Multi-technology alliance
路 Dual-mode ion source for extended depth profiling
路 Tilt modules for ARXPS measurements
Avantage software for instrument control, data processing and reporting production
Small beam spot analysis
Optional upgrade: Multiple analysis techniques can be integrated into your detection analysis. Type automatic operation
ISS: Ion scattering spectrum, which analyzes the element information of 1-2 atomic layers on the outermost surface of materials, and some isotope abundance information can be analyzed by mass resolution.
UPS: UV photoelectron spectroscopy is used to analyze the valence band energy level structure information and material surface work function information of metal/semiconductor materials
Raman: Raman spectroscopy is used to provide fingerprint information at the molecular structure level
REELS: Reflected electron energy loss spectroscopy can be used to detect the content of H element and the information of material energy level structure and band gap
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