AXIS SUPRA + Excellent Automation Technology
 
Unattended automatic sample transmission and exchange
 
Hardware automatic control, real-time monitoring of spectrometer status and calibration
 
 
AXIS SUPRA + Superior Surface Analysis
 
It has high performance XPS analysis, fast parallel chemical imaging analysis and small beam spot micro-area analysis
 
Depth analysis can be realized from ultra-thin to ultra-thick by using angle-resolved and high-energy X-ray sources
 
Multiple functional accessories (inert gas transmitters, high temperature and high pressure catalytic reaction cells, etc.) and a wide range of surface analysis techniques, such as ultraviolet photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), Auger electron spectroscopy and scanning Auger electron microscopy (AES and SAM), etc
 
 
AXIS SUPRA + Efficient Intelligent Workflow for Multi-user Environment
 
High Throughput, Fast Queue Sample Analysis Mode for Continuous Analysis
 
AXIS SUPRA + uses general surface analysis ESCAP software system to simplify and intelligently interact with the spectrometer, which can control the spectrometer, collect and analyze the data