Technical advantages:
 
1. Rapid analysis of elements between fluorine (F) and uranium (U);
 
2. Elemental analysis concentration ranges from < 1ppm to 100%;
 
3. Multi-element simultaneous measurement time is 10-60 seconds;
 
4. A variety of injectors can be selected;
 
5. Imaging samples with CCD camera;
 
6. Adjustable X-ray spot diameter of 1-15 mm to adapt to different sample sizes;
 
7. High performance electrically cooled silicon drift detector (SDD);
 
8. Multifunctional XRF application software;
 
9. Thin film thickness measurement and coating analysis;
 
10. UniQuant patented technology, excellent multi-element simultaneous analysis technology without standard samples;
 
11. Multilingual support;
 
12. Excellent mechanical durability can ensure long-term trouble-free operation;
 
13. Optional TRACEcom, which can easily interact with LIMS;
 
14. Compact design and easy movement;
 
15. Low noise, thanks to intelligent temperature control fan;
 
16. Comprehensive customization and field application method establishment function;
 
17. Easy to install and maintain.