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High resolution X-ray stress analyzer
 

 

Performance description
High-precision diffraction angle measuring device to obtain the most accurate 2 θ angle;
Realize residual stress measurement by same inclination and roll method;
The stress measurement in X and Y directions at the same point is automatically converted without operating samples;
Set the number of sample measurement points arbitrarily in the same plane, and automatically complete the residual stress measurement in sequence;
High-resolution SDD detector, when the target is fixed, can measure the residual stress of various materials;
At the same time, Si drift linear array detector is configured to quickly complete residual stress measurement;
Alpha has a large rotation range, which can realize stress measurement and pole diagram measurement by roll method;
Built-in laser ranging positioner realizes automatic positioning of samples, and the repetition accuracy is less than 3 μ m;
CCD camera and laser-assisted positioning system make manual positioning of samples easier; 
 
 

 
 
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