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Electron probe EPMA-1720 series
 

 

Technical characteristics:
 
 
The advantage lies in inheriting the high X-ray extraction angle technology of 52.5, which can carry out high-sensitivity X-ray determination.
 
The sample table driven at high speed and stability can set the analysis position and analysis area with high precision.
 
Equipped with various automatic functions and linkage functions, the setting of electron beam is simple and easy.
 
Control that integrates years of analytical experience? The analysis software realizes a clear and easy-to-understand good operating environment from data collection to data analysis and report making.
 
For beginners, it is equipped with a simple and feasible mode from SEM observation to qualitative analysis and mapping analysis.
 
Data browsing program can conveniently manage data batches.

 
 
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