Technical advantages:
 
Excellent transverse resolution of ellipsometry: It can distinguish micro-area over 1um, and realize ellipsometry analysis of micro-structure samples and micro-samples
 
Classical extinction imaging ellipsometer has high sensitivity and accuracy, and there is no dead angle in the whole range measurement of Δ and Ψ; The 4-zone nulling method can eliminate systematic errors and is an accurate method for ellipsometry analysis
 
Complete liquid film analysis system for gas/liquid interface, liquid/liquid interface, liquid/solid interface and gas/solid interface film analysis. It is an important tool for in-situ analysis of self-assembled monolayer films, emulsification and liquid deposition.
 
Real-time ellipsometry contrast image, real-time video image analysis of sample surface. All the microstructures, defects, contamination and dynamic processes of the sample will be seen at a glance
 
Selective area analysis technology realizes regional ellipsometry analysis and test. Parallelization parsing technology allows you to parse multiple regions synchronously
 
The integrated platform of imaging ellipsometry analysis realizes the combination of various measurement technologies. So as to get more information from the sample
 
Quan Huafu focusing technology is optional, which perfectly solves the problem that the objective lens scanning is needed to obtain Quan Huafu focused photos because the ellipsometer is incident at an oblique angle and the focal plane of the objective lens intersects with the sample surface. It is suitable for in-situ analysis of dynamic samples, such as the growth and movement of self-assembled monolayers, protein interaction and drift of water surface monolayers, etc.