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Research grade automatic ellipsometer
 

 

Main features:
 
Fully automated design, autofocus, calibration
 
New optical path and circuit design, higher measurement accuracy and faster speed
 
50KHz high frequency PEM phase modulation technology, measuring no moving parts in the optical path
 
Double grating spectrometer system has high stray light suppression level
 
8-size micro-spot, visual technology
 
Automatic platform sample scanning imaging

 
 
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