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One-key automatic fast ellipsometer
 

 

Main features
 
 
 
1. Liquid crystal modulation technology, no mechanical rotating parts, high repeatability and signal-to-noise ratio
 
2. Technology imaging system technology, all samples can be imaged. For transparent samples, the back reflection signal of samples is automatically removed, which makes data analysis simpler.
 
3. Reflective micro-light spot, covering the whole spectrum, is beneficial to the test of non-uniform samples and patterned samples
 
4. High automatic integration and simple installation and maintenance
 
5. One-click operation software, fast and simple
 
6. Automatic MAPPING scanning to analyze the uniformity of sample coating

 
 
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