The wafer level anti-irradiation circuit test system based on X ray is designed and developed by Shenzhen Easyjet Test Technology Co., LTD. Using 10keV X-ray as the radiation source to carry out the effect test is not only easy to implement and save money, but also a feasible means to evaluate the radiation resistance level of the device before the device is packaged.

The 10keV X-ray source system can be used to accomplish:

Basic radiation response analysis of a device with a specific structure
The experimental results are used to track the reinforcement of a given process
Rapidly improve the reinforcement feedback of mass - produced chips.

Compared with the 60Co γ-ray radiation source, based on the X-ray wafer level anti-irradiation circuit test system small size, small footprint, suitable for laboratory and factory production line use, and simple operation, convenient adjustment, through the panel parameter setting and operation, can accurately control the radiation dose rate, and adjustable radiation dose rate range is larger. Equipment safety is good, the radiation around the instrument and ordinary environment is no difference.