Product Description:
 
Micro probe chamber is a unique device suitable for detecting and analyzing the electrical and optical properties of materials. Its advantage is that it can realize in-situ measurement in various environments (such as vacuum, Electrical and optical properties of temperature, gas introduction, humidity, light irradiation, etc. The probe chamber is simple and convenient to operate. It can be used with other detection instruments (such as IV test source meter, LCR meter, Raman spectrometer, AFM, XRD, etc.). It is very suitable for research and development in universities, research institutes and enterprises.
 
 
 
 
Product application:
 
-IV Test
 
-Photocurrent scanning
 
-OPV, perovskite photovoltaic cell
 
-OLED, perovskite LED
 
-Characteristics of thermoelectric materials
 
-Transistor, diode, LED... test
 
-Measurement of thermal conductivity of thin film materials
 
-Electrical/optical properties of phase change materials (metal oxides, memristors, etc.)
 
-Features of MEMS/NEMS
 
-used in conjunction with Raman spectroscopy
 
Hall effect test
 
-Two-dimensional material property test