Technical introduction
 
It is not very reliable to measure the thickness of metal films and dielectric films with too thin film thickness by optical method. The kSA XRF system was introduced to solve this problem. It can measure the film thickness on many different material substrates (such as glass and solar cell modules) online.
 
 
 
 
Equipment details
 
Equipped with protective custom frame housing, X-ray source and detector are placed.
 
The equipment is bridged with the conveyor line, which is convenient for equipment installation and factory users to access the system.
 
When the X-ray source is in use, a warning light flashes.
 
Front/rear edge photodetectors equipped with panels are used to trigger automatic start-stop of equipment.
 
Cabinet controller provides data processing and storage functions.
 
Equipped with a small lighthouse to indicate the detection situation.